Scanning Electron Microscope

Zeiss Neon40 CrossBeam

• 'Focused ion beam workstation' (FIB)

• Detektor für energiedispersive Röntgenspektroskopie (EDX)

• STEM-Detektor

• Elektronen- und Ionenstrahlithographie

Request for SEM Measurement

Please contact one of the following persons for SEM measurements:

Ruth Bruker, ruth.brukeruni-koeln.de, phone +49-221-4706848
Stefan Roitsch, sroitschuni-koeln.de, phone +49-221-4704546