Atomic Force Microscopy (AFM) - AIST-NT
Technical Data | Atomic Force Microscopy (AFM) |
| Company: | AIST-NT |
| Model: | SPM SmartSPM™‐1000 |
| Application: | Fully automated surface characterization at the nanoscale |
| Measuring system: | - Contact mode with lateral force
- AC mode, with digital lock-in for frequency-independent phase or frequency measurement
- Force spectroscopy with multiple triggering and switching on any Feedback loop (force clamping) and force mapping
- Electric Force Microscopy (EFM)
- Magnetic Force Microscopy (MFM)
- Surface Potential/Kelvin Probe
- Nanolithography and Nanomanipulation
- Piezoresponse Force Microscopy (PFM)
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| Sample size: | Up to 80 mm in diameter |
| Temperature range: | Between -15 °C and + 120 °C, 0.1 °C resolution |
| Control system: | - Modular fully digital expandable controller
- Software controlled modulation possibilities for probe, X, Y and Z scanners, Bias voltage and two external outputs
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| Key features: | - High scanning speed; max. scan range 100 х 100 х 15 μm³
- Positioning accuracy of the probe and no distortion of the image achieved by using the scanner with capacitive closed loop sensors
- “Qscan” scanning mode (wide range of settings for scanning)
- Low-noise optical registration system with infrared laser allows for studying samples which are sensitive to the visible light
- Automation of measurements including automatic laser and photodiode positioning and setting of measurement parameters
- Motorized XY sample positioning in the range of 5 х 5 mm²
- Expandable digital modular controller
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