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Atomic Force Microscopy (AFM) - AIST-NT

Technical Data

Atomic Force Microscopy (AFM)

Company: AIST-NT
Model: SPM SmartSPM™‐1000
Application: Fully automated surface characterization at the nanoscale
Measuring system:
  • Contact mode with lateral force
  • AC mode, with digital lock-in for frequency-independent phase or frequency measurement
  • Force spectroscopy with multiple triggering and switching on any Feedback loop (force clamping) and force mapping
  • Electric Force Microscopy (EFM)
  • Magnetic Force Microscopy (MFM)
  • Surface Potential/Kelvin Probe
  • Nanolithography and Nanomanipulation
  • Piezoresponse Force Microscopy (PFM)
Sample size: Up to 80 mm in diameter
Temperature range: Between -15 °C and + 120 °C, 0.1 °C resolution
Control system:
  • Modular fully digital expandable controller
  • Software controlled modulation possibilities for probe, X, Y and Z scanners, Bias voltage and two external outputs
Key features:
  • High scanning speed; max. scan range 100 х 100 х 15 μm³
  • Positioning accuracy of the probe and no distortion of the image achieved by using the scanner with capacitive closed loop sensors
  • “Qscan” scanning mode (wide range of settings for scanning)
  • Low-noise optical registration system with infrared laser allows for studying samples which are sensitive to the visible light
  • Automation of measurements including automatic laser and photodiode positioning and setting of measurement parameters
  • Motorized XY sample positioning in the range of 5 х 5 mm²
  • Expandable digital modular controller